Various laser scanning strategies of multitrack products, consisting of a default Raster pattern (R1), a Raster pattern with a changed line order (R2), and a default Zigzag pattern (Z1), with different overlap rates ranged from 0.7 to 0.5, have been conducted to investigate microstructure evolution for Mg–3Al–1Zn alloy. As the overlap rate changes from 0.7 to 0.5, the average grain size decreases and the texture is slightly concentrated, except for R2 pattern. For effect of different scanning pattern, a relatively small average grain size can be obtained using the R1, R2 patterns compared to using the Z1 pattern; a relatively weak texture can be obtained using the R1, Z1 patterns compared to using the R2 pattern. The utilization of Z1 pattern results in a further texture weakening compared to that of the R1 pattern. Microstructure evolution of scanning strategy is mainly determined by low-undercooling-required epitaxial growth along temperature gradient directions at the solid/liquid interface. Combined with computational thermal-fluid dynamics simulation, a strong fluid flow within the molten pool promotes side expansion of the molten pool, resulting in the larger overlap area, the corresponding three-times remelting domain and continuous deflections of grain major axes.