Microcrystalline BaTi1−xSnxO3–0.5mol%GeO2x=0, 0.1, 0.3, 0.5 (BTSx–0.5Ge) and BaTiO3 (BT) ceramics (1–0.5μm) were prepared by a conventional solid-state reaction method. The crystalline structure of the samples was examined using XRD, the microstructure was analyzed by means of electron microscope and the density was measured by the Archimede’s method. The sintered ceramic disks have a tetragonal symmetry for BT, pseudo cubic for BTS1–0.5Ge and cubic symmetry for the other studied materials, with a gradual increase of unit cell dimensions. Small addition of GeO2 can improve the density of BT ceramics: 97.9% for BT–0.5Ge, and 96.21% for pure BT. The highest degree of densification in the case of tin doping is achieved for BTS1–0.5Ge (96.93%). The formation of a liquid phase can lead to an anomalous grain growth, and in the case of BT–0.5Ge the grains are completely surrounded by a frozen eutectic melt. For the dielectric constant, while increasing the Sn concentration, the TC gradually shifts towards lower temperatures, and the peak of this transition becomes broader. The lowering of TC is mostly due to the concentration of tin ions and in a much delicate way to Ge ions. Anomalies are noticed for the orthorhombic transition, where the permittivity is higher than the same transition of the matrix (BT), with a shift towards higher temperatures. The BTS3–0.5Ge and BTS5–0.5Ge are the most stable compositions in terms of dielectric behavior, since in the temperature range 200–400K, ε′r is almost constant. Therefore, these compositions can be used for devices that operate over a wide range of temperatures and frequencies.
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