Active brazing is an effective technique for joining diamond or cBN grit to metallic substrates. This technique is currently used to manufacture superabrasive, high-performance tools. The investigation of interface reactions between diamond and active brazing alloys plays an important role in understanding and improving the brazing process and the resultant tool performance. Focused ion beam (FIB) milling enabled the high resolution investigation of these extremely difficult to prepare metal–diamond joints. The interfacial nanostructure is characterized by the formation of two layers of TiC with different morphologies. First a cuboidal layer forms directly on the diamond and reaches a thickness of approximately 70 nm. Then a second layer with columnar TiC crystals grows on the first layer into the brazing filler metal by a diffusion-controlled process. The combined thickness of both TiC layers varies between 50 nm and 600 nm depending on the brazing temperature and holding time.
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