Taking advantage of the heavy ion acceleration program, tests on radiation effects with Ultrahigh Energy (UHE) xenon ion beams (with Energy > 5 GeV/nucleon) have been performed in several experimental areas of the CERN accelerator complex. Specifically, the outcomes of the first UHE heavy ion test campaign carried out at the CHARM facility are presented and discussed in this contribution. UHE ion beams have the advantage of not requiring a previous modification of the samples or testing in vacuum, owing to their large penetration range. The unique nature of the UHE ions motivated the study of their interaction with matter, with regard to the induction of SEE. To that end, great effort was paid on the calibration of the beam line instrumentation, typically prepared for the traditional proton runs. Electronic components sensitive to single event upset (SEU) and single-event latchup (SEL) were irradiated by an UHE xenon beam, with a particular interest in studying the sub-LET cross section region and benchmarking against the standard heavy ion test beams. Finally, the suitability of UHE ion testing for Radiation Hardness Assurance is also discussed in the contribution.