The lifetime of the 2p10(3S1) level in the NeI 2p53p configuration has been measured by means of the cascade-free two-step excitation technique of beam-gas-dye laser spectroscopy. The lifetime determined is τ=(25.43±0.09) ns, where the uncertainty quoted corresponds to one standard deviation. By using the same excitation technique the absolute transition probabilities of all fine-structure transitions from 2p10 to the four levels 1si(i=2⋯5) in the 2p53s configuration have been measured, too. The high level of experimental accuracy attained enables a comparative evaluation of the theoretical methods used in the literature to calculate the radial and angular parts of the transition integrals.