Abstract

Bend contour pattern maps for titanium and mica single crystals have been presented elsewhere. Such maps are useful for determining and setting up precise orientations and for measuring tilt angles more accurately than selected area diffraction patterns. Even when the BCP is distorted, these determinations may be carried out. Further, BCPs have the advantage of being visible in the image plane of the transmission electron microscope. Kossel-Mollenstedt patterns (K line patterns) have been described and applied to construct a zone axis pattern map for graphite. In this communication both of these crystallographic contrast techniques have been applied to single-crystal zirconium. These techniques should also be applicable to specimens with small grain sizes and to alloy specimens.

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