Abstract

The core strength ofTEMis that you can obtain both a DP and an image from the same part of your specimen (not to mention various spectra). To obtain the crystallographic data, a method for interpreting and indexing the DP is essential and this aspect is the theme for the next four chapters. We’ll start in this chapter by considering classic selected-area diffraction (SAD) patterns (SADPs) and how to index them, but also introduce other related, if less widely used, parallel-beam diffraction methods.

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