Abstract
ZnO and ZnO:Mo:In nanofilms were deposited on SiO2 substrate at 460 °C by the spray pyrolysis method with the molar ratio (Mo/Zn) set at 1% and (In/Zn) dosed at 1%, 2%, 3% and 10%. The optical, dielectric and photonic characteristics of these samples were analyzed from the optical spectra of transmission and reflection, which revealed the presence of two absorption edges. The first one was related to the ZnO:Mo:In typical transition and the second edge originated from the ZnO:Mo:In/SiO2 interface transition by the probable formation of an ultrafine layer identified as SiOx and/or ZnO(1−x)SiO2(x). The optical gap and Urbach energies of ZnO:Mo:In nanofilms varied almost uniformly and in a complementary manner depending on the co-doping of ∼3.28–3.24 eV and ∼82–136 meV. These energies associated with the interface varied randomly from 3.93 to 4.18 eV and ∼263 to 408 meV, and showed strong dependencies with the structural, crystalline and vibrational properties previously studied. They also displayed possible correlations with electron scattering time and the dc photoconductivity which reaches high value for film prepared using In = 2%. AFM study showed variable morphologies of the surfaces that are responsive to codoping elements, therefore at the interface, wherein the film growth began. All these factors influenced the results described above. The study also showed good agreement between rms roughness and TC texture coefficient of the studied films, of high transparency ∼89–92%. The films prepared with In = 2% revealed a high photoconductivity and could be used in photocatalytic and photonic applications.
Published Version
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