Abstract
Novel ZnO combined structures were obtained using the radio frequency (RF) sputtering method. The effects of two different substrates, Si and 128° YX LiNbO3, on the structural, morphological, and optical properties of ZnO films were investigated. Field emission scanning electron microscopy clearly revealed the formation of a mixed flake-corolla lobe-like structure. The grain size of the obtained structure depended on the substrate type. Two different X-ray diffraction peaks were obtained for ZnO growth on LiNbO3, at the (200) and (201) diffraction planes, respectively.
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