Zero- and low-field ?+ spin relaxation behavior in MnSi

Abstract

As is demonstrated in the present work, the zero-field technique is a powerful method in studying diffusion/trapping of the μ+, especially for the case of slow hopping. In the case of MnSi, the hopping time τc has been determined to be longer than 20 μsec, with the width of the nuclear random fields Δ/γμ = 3.80 ± 0.4 Oe. The role of the μ+ in low-field relaxation studies is unique, since it provides information inaccessible to NMR techniques.