Abstract
The effects of excess yttria on the structural and electrical properties of the YBa2Cu3Ox (YBCO) thin films are studied. The films were deposited on (LaAlO3)0.3–(Sr2AlTaO8)0.7 substrates by pulsed laser ablation from targets with different elemental composition. An increase of yttrium content of the target leads to formation of porous films with significantly improved current-carrying capabilities. Structural studies of these films reveal presence of yttria nanoparticles embedded into the YBCO matrix. The highest obtained critical current density in an external magnetic field of 5T was 2.6MA/cm2 at 50K and 9.4MA/cm2 at 20K. The fabricated Y-enriched YBCO films remain c-oriented at least up to 600nm thickness with no significant suppression of the critical current density.
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