Abstract
Multiple photoionisation of Xe has been studied in the M-shell ionization region (650-1270 eV) using a time-of-flight mass spectrometer. The efficiency of multiple photoionization increases in the 3d electron transition region. Partial cross sections for Xe4+, Xe5+ and Xe6+ yields have an energy dependence similar to that of the photoabsorption cross section in this region. At the 3p threshold, the partial photoionization cross sections of Xe7+ and Xe8+ increase considerably. Double Auger transition is estimated to occur at least about 40% in de-excitation processes from M-shell hole states.
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