Multiple photoionization in Ne, Ar, Kr and Xe from 44 to 1300 eV

Abstract

Yields of multiply charged ions produced from photoabsorption of Ne, Ar, Kr and Xe over the photon energy range 44–1300 eV have been measured using a time-of-flight mass spectrometer and monochromatized synchrotron radiation. The ion yields were converted into partial photoionization cross-sections using the total photoionization cross-sections reported in the literature. These partial photoionization cross-sections show the relative importance of shake-up or shake-off processes in the initial photoabsorption step and the subsequent Auger transitions in the production of multiply charged ions.