Abstract
Accurate yield optimization and statistical analysis of microwave components are crucial ingredients for manufacturability-driven designs in a time-to-market development environment. Yield optimization requires intensive simulations to cover the entire statistic of possible outcomes of a given manufacturing process. Performing direct yield optimization using accurate full-wave electromagnetic simulations does not appear feasible. In this article, an efficient procedure to realize electromagnetics (EM) based yield optimization and statistical analysis of microwave structures using space mapping-based neuromodels is proposed. Our technique is illustrated by the EM-based statistical analysis and yield optimization of a high temperature superconducting (HTS) microstrip filter. © 2002 John Wiley & Sons, Inc. Int J RF and Microwave CAE 12: 79–89, 2002.
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