XRD peak broadening modelling for Al-alloys characterization compared with Rietveld profile analysis

Abstract

In this work, a facile novel modeling approach was used for XRD microstructural elements, such as Scherrer (Sch.) size of crystallite, Williamson-Hall (WH) size of crystallite, and microscopic or internal strain. These elements were evaluated by the broadening parameters defined as the experimental broadening, crystallite size broadening, and strain broadening using the novel approximation approach. This approach was applied to the strained 3004 Al-alloys. XRD results via this modeling approach are obtained by refinement approach. Rietveld refinement, MAUD software, is served as a comparing and confirming tool. The Sch. and WH dislocation densities, defect densities, flow stress values in addition to stored energies are defined by this novel method also. These acquired results are approximately analogous to the RM method. For additional XRD analysis, the grain preferred orientation and the plane spacing (dhkl) are estimated.