Abstract
AbstractUsing Lang and double‐crystal X‐ray topographic methods the dislocation structure of dendritic silicon crystals have been investigated. It is shown that the surface layers of these crystals have a more perfect structure than their bulk volume. The twin lamella is a dislocation‐free formation and there are dislocation‐free zones ∼ 1,5 mm in width in the volume of crystals.
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