Abstract
We performed X-ray photon correlation spectroscopy (XPCS) of rubber containing filler during vulcanization. Using XPCS, we successfully measured the change in the scattering intensity fluctuation, that is, the structural fluctuation of filler in rubber during vulcanization. XPCS also revealed the change in intensity fluctuation with sample temperature. Thus, XPCS is shown to be a promising tool for investigating the dynamics of filler in rubber, which is a key to understanding the reinforcement of rubber by filler.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Paper version not known
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
