X-ray investigation of the Gd–Zn–Si system

Abstract

The isothermal section of the Gd–Zn–Si phase diagram at 600°C over the whole concentration region has been constructed using X-ray phase analysis and in part microprobe analysis (CAMEBAX-device). The formation of the previously reported phase GdZnSi (AlB2 structure type) was confirmed, and one new ternary compound was observed. The crystal structure of the GdZnxSi2−x (x=0.48–0.54) (α-ThSi2 structure type) compound was determined using X-ray powder diffraction data. An investigation of the GdSi2−x-phase also was performed.