Abstract
ABSTRACTThe potential capabilities of the x‐ray spectral analysis method and the efforts of many researchers have ensured its widespread use in industry and scientific research. X‐ray fluorescence analysis (XRF) is one of the non‐destructive methods widely used to determine the chemical composition of automobile catalysts, solar panels, coins, jewelry, and so forth. In recent years, the problems of studying gold and silver objects of artistic value have attracted great interest. This paper presents a review of work on determining the chemical composition and thickness of single‐layer and multi‐layer coatings of artifacts and other objects of study with surfaces of complex configuration using the ratio of the intensities of characteristic x‐ray radiation of α‐ and β‐lines.
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