Abstract
Thisreport describes analytical techniques for major and trace elements in silicate rocks by X-ray fluorescence (XRF) spectrometry. The analyzed elements are SiOz, Ti02, A1203, total Fe203, MnO, MgO, CaO, Na20, K20, P2Os, Sc, V, Cr, Ni, Cu, Zn, Rb, Sr, Y, Zr, Nb, Ba, La, Ce, Nd and Pb. All of these elements were determined on a single glass bead made from mixtures of 1 g of sample powder, 5 g of Li2B407 flux and about 50 mg of Lil releasing agent. A series of synthetic standard samples were prepared from pure chemical reagents to calibrate an XRF spectrometer. Matrix and line overlap corrections using a fundamental parameter approach yields reliable calibration lines with wide optimal ranges of composition. Analytical results of GSJ geochemical reference samples are in good agreement with their recommended values and exhibit sufficient precision and sensitivity for both major and trace elements.
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Schedule a callMore From: Bulletin of the Kitakyushu Museum of Natural History and Human History, Series A (Natural History)
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