X-ray evaluation of the CMOS image sensor IU233N5-Z and readout the scintillation light

Abstract

We evaluated the performance of a SONY CMOS sensor, IU233N5-Z with a very small pixel size of 1.12μm and 1 million pixels, for imaging X-rays, α and β rays. The energy resolution of X-rays was 180 eV at 5.9 keV and 184 eV at 6.5 keV when irradiating the CMOS sensor with 55Fe, and 344 eV at 14.4 keV when irradiating the CMOS sensor with 57Co, which is similar to that of the CCD detector even at room temperature. Furthermore, We read out the optical light of a CsI(Tl) scintillator by this CMOS detector and obtained a detection efficiency of ∼5%.