X-ray diffraction methods: single crystal

Abstract

Lattice-parameter determination using X-ray diffraction methods on single crystals is reviewed. All the methods are classified with respect to the measurement technique, in particular into photographic and counter-diffractometer techniques. The methods are described in approximately chronological sequence, i.e. from the earliest and simplest rotating-crystal method to the latest non-dispersive techniques, and at the same time from those of poor accuracy and precision to those attaining the highest precision and/or accuracy. In each of the methods realizing a given technique, first the absolute and then the relative method are described. Keywords: cameras; divergent-beam techniques; Kossel method; lattice-parameter changes; lattice-parameter determination; photographic methods; single-crystal X-ray techniques; single-crystal methods; systematic errors; X-ray beam