Abstract

The determination of lattice parameters using X-ray powder methods is reviewed. Topics covered include: wavelength errors, refraction and statistical fluctuations; geometrical and physical aberrations; angle-dispersive diffractometer methods (using conventional and synchrotron sources); whole-pattern methods; energy-dispersive techniques; camera methods; testing for remanent systematic error; powder-diffraction, intensity and instrumental line-profile-shape standards; and factors determining accuracy. Keywords: aberrations; accuracy; analytical extrapolation of lattice; angle-dispersive diffractometry; Bragg angle; camera methods; detection; diffractometry; errors; geometrical aberrations; lattice-parameter determination; physical aberrations; powder diffraction; refraction; remanent systematic errors; standard reference materials; standard specimens; statistical fluctuations; synchrotron radiation; systematic errors; wavelength problems; X-ray powder techniques

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