Abstract
The kinematical theory of X-ray diffraction by hcc crystals with growth and deformation faults is developed. The intensity distribution in reciprocal space is derived as a function of five parameters which represent three growth and two deformation fault probabilities. Only reflexions with H- K ≠ 3N, N an integer, are affected by faulting and generally exhibit changes in integrated intensity and broadening. In addition, reflexions with L= 6M ± 1 and 6M ± 2, M an integer, exhibit profile peak shift and profile asymmetry. It is shown that nine independent combinations of the five fault probabilities can be determined from the measured profile characteristics.
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