X-ray diffraction analysis of orthorhombic SnSe nanoparticles by Williamson–Hall, Halder–Wagner and Size–Strain plot methods

Abstract

SnSe nanoparticles were synthesized using the sonochemical exfoliation technique, employing SnSe single crystals. Various analysis, including Energy Dispersive Analysis of X-rays-Elemental mapping, X-ray Diffraction (XRD), High-Resolution Transmission Electron Microscopy, Ultra-Violet Diffused Reflectance Spectroscopy-Photoluminescence measurements, Raman spectroscopy, and X-ray Photoelectron Spectroscopy, were conducted to determine the chemical composition, crystalline phase, morphological characteristics, optical properties, vibrational modes, and oxidation states of the synthesized nanoparticles. The XRD peak broadening analysis, specifically employing Williamson–Hall (W-H), Size–Strain Plot (SSP), and Halder–Wagner Method (H-W), was employed to examine particle size and intrinsic strain. Additionally, three models within the W-H method, namely the uniform deformation model (UDM), uniform stress deformation model (USDM), and uniform deformation energy density model (UDEDM), were used to investigate physical and microstructural parameters such as strain, stress, and energy density. A comprehensive comparison of the average particle size results obtained from Williamson–Hall, Size–Strain, and Halder–Wagner Methods, along with results from HR-TEM and Particle Size Analysis, was carried out. The comprehensive comparison of results from different techniques adds credibility to the reported findings.