Abstract
The last few decades have seen rapid development in computational and theoretical tools for simulating, fabricating, and characterizing material systems. In this report, the potential of surface characterization by x-ray photoelectron spectroscopy (XPS) to provide rapid elemental and chemical state information is presented. The development of the group analysis array functionality is significant for facilitating processing and display of large datasets in the application of XPS analysis to combinatorial materials discovery. We demonstrate that group array analysis provides a more detailed understanding of the chemical distribution across a Ni-Ti-Co combinatorial thin-film materials library.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
