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https://doi.org/10.1039/d3qm01036h
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Cite Journal: Materials Chemistry Frontiers |  Publication Date: Jan 1, 2024 |
 Citations: 15 |
Affiliation: Yangzhou University
X-ray photoelectron spectroscopy depth profiling combined with ion beam etching methods is a primary tool to study the chemical composition of functional materials at different scales from the surface to the bulk.
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