Abstract
The interaction between ultrathin layers of Cu and Cr 2O 3(0001) surfaces was studied by X-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy and low-energy electron diffraction (LEED). The XPS results indicate that copper deposited on the Cr 2O 3(0001) surfaces is initially in a Cu(I) state, and an agglomeration of copper on the Cr 2O 3(001)-1 × 1 surface was seen with increasing copper coverage. A Cu(111)R30° Cr 2O 3 (0001)-1 × 1 epitaxial relationship was observed by LEED.
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