X-ray timing detectors with HfO2 nanoparticle-loaded plastic scintillator and silicon avalanche photodiode

Abstract

We successfully developed 20- and 40-wt% HfO2-nanoparticle-loaded plastic scintillators (Hf-PLSs), and subsequently, assembled X-ray timing scintillation detectors using the Hf-PLSs and silicon avalanche photodiodes (Si-APDs) as the photodetector. Two types of Si-APDs were examined for two different detectors. A proportional-mode APD (pAPD) exhibited a nanosecond response, but a relatively low internal gain of less than several hundred. By contrast, a Geiger-mode APD exhibited a high gain of 105−6, but its output pulse width was longer than several tens of nanoseconds; the pixelated device is called as SiPM. A pAPD (Hamamatsu Photonics S8664-4433, 3 mm in diameter) was used as the photodetector and was combined with 20 wt% Hf-PLS (∼3 mm cube) as the X-ray scintillation timing detector. A SiPM (Hamamatsu Photonics S13360-3025, 3 mm × 3 mm) was assembled with 40 wt% Hf-PLS (∼3 mm cube). The characteristics of the two types of scintillation timing detectors were evaluated using a 57.61-keV synchrotron X-ray beam to assess their applicability in nuclear resonant scattering experiments. Both the detectors were cooled down to −35 or −20 °C to reduce noise and obtain a higher APD gain. A good time resolution of (0.31 ± 0.04) ns (FWHM) was easily obtained with the SiPM detector using a large APD gain at −20 °C, although the time resolution of the pAPD detector finally reached (0.39 ± 0.04) ns (FWHM) at −35 °C owing to a small gain of 146. However, a maximum count rate of over 1.4 × 107 s−1 was observed owing to the fast response of the pAPD detector, whereas the SiPM detector exhibited a maximum count rate of 5.9 × 106 s−1 because of the long pulse tail of ∼30 ns.