Abstract
The change in peak positions of a diffraction line with sin2 ψ for various applied stresses σo was measured for determining residual stress of textured materials by X-ray diffraction. Three specimens were prepared from a sintered silicon carbide α-SiC and a cold-rolled stainless steel type SUS304. For each applied stress σo, seven peak positions for different ψ angles were measured. They were oscilated on the sin2 ψ diagram. However, the slope M and the intercept N of the straight line that was fitted to the seven peak positions varied linearly with the applied stress σo. It is confirmed analytically and experimentally that this experimental evidence shows that the lattice strain for a fixed ψ angle varies linearly with applied stress as is the case with isotropic materials. Therefore, the stress constant K of textured materials can be determined experimentally as the reciprocal of the slope of the straight line of the M-σo diagram.
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