Abstract
We present a study of interdiffusion at interfaces of YBa2Cu3O7-x (YBCO) and metals, Au, Ag, and Pb by using X-ray reflectivity. YBCO thin films were epitaxially grown by off-axis sputter deposition and coevaporation, with the c-axis perpendicular to the SrTiO3 substrate surfaces. The capping layers were subsequently deposited on the YBCO film in situ and ex situ near room temperature. Glancing incident X-ray reflectivity was employed to investigate the surfaces and their buried interfaces. We find that interdiffusion at the interfaces of Au/YBCO and Ag/YBCO is negligible. However, a large interdiffusion zone, ∼ 60 Å, is present at the Pb/YBCO interface and the lead films grown, both in situ and ex situ, were entirely oxidized. We do not observe any diffraction peaks from the Pb/YBCO films. The diffraction peaks are found up to (007) from the YBCO films of the Au/YBCO and Ag/YBCO films. This implies that the loss of crystalline structure in a ∼ 300-Å-thick YBCO film underneath Pb is caused by interdiffusion.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
