Abstract
X-ray photoelectron spectroscopy has been used to determine the binding energies of the core electrons in Ag-doped amorphous thin Ge x Sb 40− x S 60 films ( x=15, 20, 25 and 27). Chemical shifts of the constituent elements have revealed that electrons are transferred from chalcogenide to metal and compounds such as Ag 2S and Ag 2O are likely to form due to photo-induced chemical modification and oxidation, respectively. Charge defects are induced in the amorphous system.
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