Abstract

Abstract Laser ablated samples of poly(ether imide) were analyzed by XPS-imaging and by small area X-ray photoelectron spectroscopy (XPS). XPS-imaging was capable of detecting concentration variations of the order of 1.5% and revealed a relatively homogeneous deposition of carbon soot around the laser-ablated hole. A clear modification of the poly(ether imide) by the laser irradiation was determined within the laser-ablated hole by small area XPS. While the relative carbon content of the polymer was increased, the nitrogen and oxygen content was reduced.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.