Abstract
Abstract Platinum deposited by thermal evaporation in vacuum on the (110), (100) and (001) surfaces of rutile TiO 2 single crystals was studied by X-ray photoelectron diffraction (XPED). For the (110) and (100) surfaces, after Pt deposition and annealing, an intense modulation of the photoelectron intensity as a function of the emission angle was observed from the Pt overlayer. From these results, a structural analysis was performed using a theoretical treatment based on the scattering of electrons. In both cases we found that most of the Pt clusters grew epitaxially with the (111) plane parallel to the substrate surface. For the (001) oriented substrate, the modulation in the Pt XPED pattern was found to be weak, so that complete structural analysis could not be performed.
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