Abstract
X-ray Pendellosung interference has been observed in reflection in garnet epitaxial layers. The reflection case differs from the well-studied transmission case in that the two interfering wave fields are generated one at the front surface and one at the back surface of the layer. Absolute thickness measurements of the layer are obtained by recording the interference maxima as a function of the specimen orientation and “fringe topographs” reveal local bending of the layer lattice planes.
Full Text
Published Version
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call