Abstract
A new x-ray luminescence based spectrometer was developed and installed to examine the scintillation properties of materials while revealing the origins of luminescence and investigating trapping defects. Measurements were performed on a number of undoped and Ce doped yttrium aluminum garnet crystals and various luminescence centers were characterized. The measured x-ray luminescence spectra provide information about the spectral range and the scintillation efficiency and linearity. The efficiency of charge-carriers production due to x ray, their energy transfer to the luminescence centers, and the efficiency of luminescence are all reflected in the efficiency of x-ray luminescence.
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