Abstract
X-ray evanescent- and standing-wave fluorescence measurements made using a platinum-carbon layered synthetic microstructure (LSM) overcoated with a 5 Å hafnium layer are reported and compared with model calculations. Good agreement between experiment and calculation is shown in the evanescent-wave fluorescence regime. Agreement between calculation and experiment is also found in the standing-wave fluorescence regime at the LSM super-lattice Bragg reflection when the effects of imperfections in the LSM are considered. These results demonstrate sub-monolayer surface concentration sensitivity and the X-ray optic quality of the LSM/substrate structure. Potential applications of LSM evanescent- and standingwave fluorescence are discussed.
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