Layered Synthetic Microstructures (LSM): Reflecting media for X-ray optic elements and diffracting structures for the study of condensed matter

Abstract

During the past two decades techniques for synthesis of superlattices, Layered Synthetic Microstructures (LSM) in the following, have been developed to a sufficiently high level for the product structures to be used as reflecting media in x-ray optics. Additionally, since this application requires high absolute reflectivity, LSMs may be used in both traditional and unique ways to study condensed matter. A short review of synthesis processes will be given as background, with emphasis on process parameters important in LSM deposition. A short review of the reflectivity/wavelength relationship over the spectral range 1 to 500 Å is then given. Experimental results for simple planar LSM structures are then discussed with emphasis on the effects of structural imperfections and engineered variations such as those necessary to construct LSM Fabry-Perot etalons. Results for experiments in which LSMs were used as reflecting/diffracting structures for evanescent and standing wave fluorescent scattering studies will be presented and the implications of these results discussed.