Abstract
K X-ray emission spectra emitted from carbon, aluminum, silicon, phosphorus, titanium, chromium, and manganese compounds were measured, using a compact lab-scale flat crystal X-ray fluorescence spectrometer. The sensitivity of K X-ray transitions line-shape, relative to the atom's chemical speciation, is considered. Spectrometer's optimization concerning high energy resolution takes place for each measured fluorescence transition. The detected changes on the measured X-ray line-shapes allow extracting the chemical speciation of the emitting atom. In-lab high-resolution X-ray emission spectroscopy is shown to be a highly versatile technique for materials chemical characterization.
Published Version
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