Abstract
AbstractMinor amounts of rare-earth elements (0.01 to 1.0%) in high-purity rare-earth oxides may be determined by a fluorescent X-ray procedure. The analysis of high-purity yttrium, cerium, praseodymium, neodymium, and samarium is described. Basic to the method is accurate determination of spectral line intensity above background. Sample and standard preparation, choice of analytical lines, and utilization of a helium path to increase X-ray intensities are discussed. Precision and accuracy were evaluated by analyzing samples of known composition. The average of five separate determinations showed an average error of about 10 per cent.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
