X-ray diffraction of densified silica glass

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X-ray diffraction measurements were performed on silica glasses permanently densified by high pressures. The position q 1 of the first sharp diffraction peak (FSDP) of the X-ray structure factor is found to shift to higher values of the scattering vector q as the density of silica glass increases. The height of the FSDP decreases with increasing density. A linear relation between glass density ϱ and q 1 3 is observed upto 15.5% volume densification. The observed linear relation is explained by a distribution of the d-values ( d m=2π/ q 1, where d m is the mean constant of the d-values).