X-ray diffraction line profile analysis of nano-sized cobalt in silica matrix synthesized by sol–gel method

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Abstract Nano-sized cobalt particles in silica matrix have been synthesized by sol–gel method to reduce the oxidation of metallic cobalt. Different techniques of the X-ray diffraction line profile analysis (XRDLPA) have been used to determine the microstructural parameters of the nano-sized cobalt. The domain size, microstrain and lattice parameters have been estimated by the modified Rietveld technique and classical Williamson–Hall technique.