X-ray diffraction from close-packed structures with stacking faults. III.hhcccrystals

Abstract

The kinematical theory of X-ray diffraction by hhcc crystals with stacking faults is developed. The intensity distribution in reciprocal space is derived as a function of seven parameters which represent four growth and three deformation fault probabilities. Only reflexions with H - K ≠ 3N, N an integer, are affected by faulting and exhibit generally changes in integrated intensity, profile peak shift, broadening and asymmetry. It is shown that eleven independent combinations of the seven fault probabilities can be evaluated from the measured profile characteristics.