X-ray diffraction, dielectric, conduction and Raman studies in Na0.925Bi0.075Nb0.925Mn0.075O3 ceramic

Abstract

Ceramic with composition Na0.925Bi0.075Nb0.925Mn0.075O3 (NNBM0075) was synthesized by high temperature solid state reaction technique. It was studied using X-ray diffraction (XRD), dielectric measurements and Raman spectroscopy. The sample crystallizes in orthorhombic perovskite structure with space group Pbma at room temperature. Dielectric properties of the ceramic was investigated in a broad range of temperatures (−150 to 450 °C) and frequencies (0.1–103 kHz), and show two different anomalies connected to the symmetry change and electrical conductivity. Dielectric frequency dispersion phenomena in the NNBM0075 ceramic was analyzed by impedance spectroscopy in the temperature range from 55 to 425 °C. The Cole-Cole analysis based on electrical circuit and least square method was used to characterize the conduction phenomenon. A separation of the grain and grain boundary properties was achieved using an equivalent circuit model. The different parameters of this circuit were determined using impedance studies. Four conduction ranges, with different activation energies, were determined using the Arrhenius model. Raman spectra were studied as a function of temperatures and confirmed the X-ray and dielectric results. This composition is of interest for applications due to his physical properties and environmentally friendly character.