Abstract

Wrinkled Graphene Oxide has been produced from both glow electrolytic thermal arc discharging of graphite rods combined with hummer’s process. Wrinkling in GO was enhanced by low defects, multilayer clusters, and variegated-edge interaction amongst graphene clusters. The composition of GO was confirmed by XPS, while the low defect level clearly marked by higher planar order and low ID/IG band. The GO morphology is captured by optical microscope and TEM. While arc discharge maintains the graphitic quality of the GO, the slightly modified hummer’s process did not introduce as much defects as the GO used in previous works. The wrinkled GO dispersion is optimal for quenching for DNA biosensors, and it is also applicable for similar high volume and high storage modulus epoxy composites, and other diverse materials and energy applications.

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