Abstract
Contamination control engineers provide critical plans to monitor, mitigate, and reduce the impact of molecular and particulate contamination on spacecraft systems. Witness monitoring programs are dependable methods that utilize strategically placed witness samples on space flight hardware to monitor particulate and molecular contaminants during the assembly, integration, and test (AI&T) phases. Traditionally, optical characterization of these witness plates is the tool to determine the presence of molecular films on space flight hardware in the AI&T environment. Once a visual inspection or optical measurement identifies the presence of a contaminant, analysts collect tape lifts and wipe samples from the witness plate for analysis in an analytical lab with a potential contaminant identified within 24 hours. To speed up this process and reduce the impact to project schedule and cost the use of a non-invasive and in situ method for optical witness plate program with portable Raman spectroscopy to detect molecular contamination on spacecraft was explored.
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