Whole-field principal angle and optical path retardation measurements using white light OPD scanning polariscope with first moment algorithm

Abstract

White-light Optical Path Difference (OPD) scanning polariscope is currently an accepted technique for analyzing photoelastic specimens. While it has proven effective in overcoming limitations associated with phase-stepping and fringe scanning techniques, it is constrained when evaluating optical path retardation smaller than the light source coherence length. To address this limitation, a white-light OPD scanning polariscope, equipped with a first moment algorithm, has been introduced for the comprehensive examination of whole-field principal angle and optical path retardation. This article demonstrates the design and operational principles of the proposed polariscope, details an experimental setup for its deployment, and presents findings from practical applications of this setup. The results confirm the effectiveness and practicality of the proposed polariscope. Furthermore, these results highlight its precision, with standard deviations of 0.176° for principal angle and 6.4 nm for optical path retardation measurements.