Well-Crystalline ZnO Nanowire Based Field Effect Transistors (FETs)

Abstract

Well-crystalline ZnO nanowires were grown on Si(100) via non-catalytic thermal evaporation process using metallic zinc powder in presence of oxygen. The detailed morphological characterizations by field emission scanning electron microscopy (FESEM) and transmission electron microscopy (TEM) confirmed that the synthesized products are nanowires with the typical diameter and lengths of approximately 55 +/- 5 nm and several micrometers, respectively and are grown in high density over the silicon substrate. The detailed structural characterizations by high-resolution TEM and X-ray diffraction confirmed that the synthesized nanowires are well-crystalline and possessing wurtzite hexagonal phase. The presence of Raman-active optical-phonon E2(high) mode at 437 cm(-1) in the Raman-scattering spectrum confirms good crystal quality for the as-grown ZnO nanowires. The electrical transport properties of the as-grown nanowires were explored by fabricating single nanowire based field effect transistors (FETs). The fabricated single ZnO nanowire based FET exhibits carrier concentration and electron mobility of approximately 7.49 x 10(17) cm(-3) and approximately 8.42 cm2V(-1)s(-1), respectively.