Weissenberg Reflection High-Energy Electron Diffraction for Surface Crystallography

Abstract

The principle of a Weissenberg camera is applied to surface crystallographic analysis by reflection high-energy electron diffraction. By removing inelastic electrons and measuring hundreds of patterns as a function of sample rotation angle phi, kinematical analysis can be performed over a large volume of reciprocal space. The data set is equivalent to a three-dimensional stack of Weissenberg photographs. The method is applied to analysis of an Si(111)-square root of 3 x square root of 3-Ag surface, and the structural data obtained are in excellent agreement with the known atomic structure.