W-Band Characterizations of Printed Circuit Board Based on Substrate Integrated Waveguide Multi-Resonator Method

Abstract

This paper provides a broadband measurement method at W-band for printed circuit board (PCB) properties using multiple substrate integrated waveguide (SIW) resonators, i.e., SIW multi-resonator method. Eight SIW resonators are designed in series fed by a rectangular waveguide through coupling slots. All resonators operate at TE101 mode with different resonant frequencies. Multi-resonator Foster form is employed to obtain unloaded resonant frequency of each SIW cavity. After introducing the testing procedure, a number of samples based on different PCBs are fabricated and accurately measured to verify the feasibility of this method.